The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Jul. 12, 2016
Applicant:

Topcon Corporation, Tokyo-to, JP;

Inventors:

Hisashi Isozaki, Tokyo-to, JP;

Atsushi Shoji, Tokyo-to, JP;

Akira Ooide, Tokyo-to, JP;

Assignee:

TOPCON Corporation, Tokyo-to, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/00 (2006.01); G01S 17/66 (2006.01); G01J 1/02 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01S 17/66 (2013.01); G01J 1/0219 (2013.01); G01J 3/0264 (2013.01);
Abstract

The invention provides an illuminance measuring system, which comprises an illuminance measuring instrument which comprises a first communication unit and is moved by a moving vehicle, a position measuring means which comprises a second communication unit and is capable of measuring a three-dimensional position of the illuminance measuring instrument and a data collector which comprises a third communication unit and a storage unit for storing positional information data of a predetermined measuring point, wherein the data collector moves the moving vehicle to the measuring point based on a position of the illuminance measuring instrument as measured by the position measuring means and the positional information data, an illuminance is measured by the illuminance measuring instrument and a position of the illuminance measuring instrument at the time of illuminance measurement is measured by the position measuring means, and wherein the data collector obtains an illuminance measurement result from the illuminance measuring instrument via the first communication unit and the third communication unit, obtains a measuring position from the position measuring means via the second communication unit and the third communication unit, and collects the illuminance measurement result and the measuring position in association with each other.


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