The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Apr. 03, 2015
Applicant:
Evolv Technologies, Inc., Waltham, MA (US);
Inventor:
Alec Rose, West Hartford, CT (US);
Assignee:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/41 (2006.01); G01S 13/88 (2006.01); G01S 13/89 (2006.01); G01S 7/35 (2006.01); G06T 15/04 (2011.01); G06T 15/08 (2011.01); G06T 15/10 (2011.01); H01Q 21/00 (2006.01); G01S 15/89 (2006.01); G01S 7/04 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
G01S 7/41 (2013.01); G01S 7/35 (2013.01); G01S 13/887 (2013.01); G01S 13/89 (2013.01); G01S 15/89 (2013.01); G06T 15/04 (2013.01); G06T 15/08 (2013.01); G06T 15/10 (2013.01); H01Q 21/00 (2013.01); G01S 7/04 (2013.01); G01S 13/888 (2013.01); G06K 9/3241 (2013.01);
Abstract
Data is received characterizing a measurement for a scene received by a plurality of sensor elements forming a sensor array. Intermediate scattering coefficients can be determined using the received data by applying to the received data a mapping of a plurality of scene sub-domains to the plurality of sensor elements. A parameter of an object within the scene can be estimated using the intermediate scattering coefficients. Related apparatus, systems, techniques, and articles are also described.