The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Aug. 12, 2015
Applicant:

Arm Limited, Cambridge, GB;

Inventors:

Satheesh Balasubramanian, Bangalore, IN;

Shardendu Shekhar, Austin, TX (US);

James Dennis Dodrill, Austin, TX (US);

Sainarayanan Karatholuvu Suryanarayanan, Bangalore, IN;

Assignee:

ARM Limited, Cambridge, GB;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2882 (2013.01); G06F 17/5072 (2013.01); G06F 17/5081 (2013.01); G06F 17/505 (2013.01); G06F 17/5031 (2013.01); G06F 2217/82 (2013.01); G06F 2217/84 (2013.01);
Abstract

Various implementations described herein are directed to a system and methods for implementing a critical path architect. In one implementation, the critical path architect may be implemented with a system having a processor and memory including instructions stored thereon that, when executed by the processor, cause the processor to analyze timing data of an integrated circuit. The timing data may include transition times for cells along paths of the integrated circuit. The instructions may cause the processor to identify instances of timing degradation for the cells along the paths of the integrated circuit. The instructions may cause the processor to recommend changes for the instances of the cells along the paths having timing degradation.


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