The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Nov. 09, 2015
Applicant:

Caterpillar Inc., Peoria, IL (US);

Inventors:

Michael T. Buelsing, Peoria, IL (US);

Jean O. Bridge, Morton, IL (US);

Leon Adcock, Chillicothe, IL (US);

Gregory H. Dubay, Carlock, IL (US);

Dong Fei, Peoria, IL (US);

Donald Stickel, Chillicothe, IL (US);

Assignee:

Caterpillar Inc., Peoria, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 29/06 (2006.01); G01N 29/26 (2006.01); G01N 29/265 (2006.01);
U.S. Cl.
CPC ...
G01N 29/06 (2013.01); G01N 29/069 (2013.01); G01N 29/262 (2013.01); G01N 29/265 (2013.01); G01N 2291/2675 (2013.01);
Abstract

A system for inspecting a weld on a component where the weld has a plurality of cross-sections includes a camera disposed above the weld that optically senses a weld position. A projector disposed above the weld projects on to the component along a length of the weld position a primary scan path with a primary scan path start point and a primary scan path end point. An imaging probe scans the weld as the imaging probe moves from the primary scan path start point to the primary scan path end point to generate a plurality of 2D cross-sectional images of the weld corresponding to the cross-sections of the weld, the imaging probe having a position and skew angle that vary as the imaging probe moves. Each 2D cross-sectional image of the weld is optically encoded with a respective imaging probe position and a respective imaging probe skew angle.


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