The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9823208 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 21, 2017

Filed:

Mar. 30, 2016
Applicant:

Hitachi High-tech Science Corporation, Minato-ku, Tokyo, JP;

Inventors:

Masafumi Watanabe, Tokyo, JP;

Takehiro Yamaoka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01N 27/04 (2006.01); G01N 27/02 (2006.01); G01N 17/00 (2006.01); G01Q 60/30 (2010.01); G01L 1/10 (2006.01); G01L 1/22 (2006.01); G01L 1/20 (2006.01);
U.S. Cl.
CPC ...
G01N 27/041 (2013.01); G01N 17/00 (2013.01); G01N 27/02 (2013.01); G01Q 60/30 (2013.01); G01L 1/10 (2013.01); G01L 1/20 (2013.01); G01L 1/22 (2013.01);
Abstract

A method includes: removing at least a part of an oxide formed on a surface of the sample by relatively scanning the surface of the sample in X and Y directions parallel to the surface while bringing a probe into contact with the surface of the sample; detecting a signal by bringing the probe into contact with the surface of the sample from which at least a part of the oxide is removed at a predetermined detection position in the X direction or the Y direction while a bias voltage is applied to the sample; calculating a spreading resistance value based on the signal; and retracting the probe to keep the probe relatively away from the surface in a Z direction perpendicular to the surface while relatively moving the probe to a next detection position to start scanning the sample from the next detection position.


Find Patent Forward Citations

Watanabe, Masafumi. (2017). Method for measuring spreading resistance and spreading resistance microscope (U.S. Patent No. 9823208). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9823208

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