The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Sep. 15, 2015
Applicant:
Ut-battelle, Llc, Oak Ridge, TN (US);
Inventor:
Justin S. Baba, Knoxville, TN (US);
Assignee:
UT-Battelle, LLC, Oak Ridge, TN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01N 21/21 (2006.01); G01N 21/51 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/21 (2013.01); G01J 4/00 (2013.01); G01N 21/51 (2013.01); G01N 2021/4769 (2013.01); G01N 2021/4792 (2013.01);
Abstract
Turbidity measurements are obtained by directing a polarized optical beam to a scattering sample. Scattered portions of the beam are measured in orthogonal polarization states to determine a scattering minimum and a scattering maximum. These values are used to determine a degree of polarization of the scattered portions of the beam, and concentrations of scattering materials or turbidity can be estimated using the degree of polarization. Typically, linear polarizations are used, and scattering is measured along an axis that orthogonal to the direction of propagation of the polarized optical beam.