The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Apr. 09, 2015
Duke University, Durham, NC (US);
Adam Wax, Druham, NC (US);
Howard Levinson, San Diego, CA (US);
William J. Brown, Durham, NC (US);
Thomas Matthews, Durham, NC (US);
Manuel Medina, Durham, NC (US);
Duke University, Durham, NC (US);
Abstract
Disclosed herein are systems and methods for deep spectroscopic imaging of a biological sample. In an aspect, a system includes a broad bandwidth light source configured to generate an illumination beam, an interferometer, and a spectrometer. The interferometer includes a first beam splitter configured to split the illumination beam into an incident beam and a reference beam; an optical lens directs the incident beam onto a biological sample at a predefined offset from corresponding optical axis, and receive a beam scattered from the biological sample. The beams are configured to intersect with each other within a focal zone of the optical lens. Photons of the incident beam undergo multiple forward scattering within the biological sample. A second beam splitter configured to receive and superimpose the scattered and reference beams, to generate an interference beam. The spectrometer uses a spectral domain detection technique to assess tissue properties of the biological sample.