The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Apr. 08, 2015
Applicants:

Institut National DE LA Recherche Scientifique, Quebec, CA;

Heriot Watt University, Edinburgh, GB;

Inventors:

Matteo Clerici, Balerno, GB;

Marco Peccianti, Brighton, GB;

Sze Phing Ho, Kedah, MY;

Anna Mazhorova, Verdun, CA;

Roberto Morandotti, Montreal, CA;

Alessia Pasquazi, Brighton, GB;

Luca Razzari, Montreal, CA;

Yoann Jestin, Montreal, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); G01J 5/02 (2006.01); G01J 5/20 (2006.01); G01R 29/00 (2006.01); G01N 21/3581 (2014.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G01J 5/024 (2013.01); G01J 5/20 (2013.01); G01N 21/3581 (2013.01); G01R 29/00 (2013.01);
Abstract

A method and a system for terahertz detection, using at least a first and a second electrodes separated by a centro-symmetric material. The system comprises at least a first and a second electrodes with conductive pads for connection to a voltage source, separated by a centro-symmetric material; the method comprising second harmonic generation in the centro-symmetric material by overlapping of a probe and a terahertz beams.


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