The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Aug. 23, 2012
John F. Silny, Playa Vista, CA (US);
Stephen J. Schiller, La Miranda, CA (US);
John F. Silny, Playa Vista, CA (US);
Stephen J. Schiller, La Miranda, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
Geometric calibration of an imaging system is performed by recording visible control points in a calibration image whose geometric properties are known and calibration coefficients can be derived utilizing an image processing system for transforming the recorded image into a geometric distortion-free image. Described are methods and systems for vicarious geometric calibration of a remote sensor that include a processor configured to receive image data collected at a remote sensor, the image data including a plurality of image elements each associated with a respective reflective mirror from a plurality of reflective mirrors located at respective know positions, determine, for each of the plurality of reflective mirrors, an image location in the image data and determine one or more figures of merit based on the image locations and the known positions for each of the plurality of reflective mirrors.