The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Dec. 21, 2012
Michel Raymond Barrault, Mens, FR;
Michel Raymond Barrault, Mens, FR;
ALPAO, Montbonnot, FR;
Abstract
The invention relates to a system () comprising a deformable surface () and a first and a second sensor (C, C) designed to provide a first and a second measurement signal (S, S) intended to be collected by a processing circuit (), said system () comprising first and second measurement paths (V, V) for collecting the first and second measurement signals (S, S), said system () being characterized in that it comprises a common calibration member () for simultaneously injecting into the first and second measurement paths (V, V) a calibration signal (S), said common calibration member () being designed so that the image signals (S', S′, S′n) restored via said measurement paths (V, V, Vn) are independent of said movable surface (). Deformable movable surface systems, of the deformable mirror type.