The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Jul. 18, 2016
Applicant:

T-mobile U.s.a., Inc., Bellevue, WA (US);

Inventor:

Magesh Annamalai, Dublin, CA (US);

Assignee:

T-Mobile USA, Inc., Bellevue, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/02 (2009.01); H04W 4/22 (2009.01); H04W 76/00 (2009.01); H04L 29/08 (2006.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
H04W 4/025 (2013.01); H04L 67/18 (2013.01); H04W 4/02 (2013.01); H04W 4/22 (2013.01); H04W 76/007 (2013.01); H04W 64/00 (2013.01);
Abstract

A facility for determining the location of a mobile device when a location determination of a desired accuracy is desired. If available, the facility determines the location of the mobile device using a device-based technique or using a location determination technique that is accessible over a macronetwork. Macronetworks are networks that are designed to cover relatively large areas. If a location determination technique of desired accuracy is not available on the device or over a macronetwork, the facility attempts to use a location determination technique that is accessible over a micronetwork to determine the location of the mobile device. Micronetworks are networks that are designed to cover smaller areas. By forcing a switch from a macronetwork-based location determination technique to a micronetwork-based location determination technique, the facility ensures that a location determination is made for the mobile device of a desired accuracy, time to fix (TTF), and/or yield.


Find Patent Forward Citations

Loading…