The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Aug. 17, 2015
Applicant:

Omnivision Technologies, Inc., Santa Clara, CA (US);

Inventors:

Rui Wang, San Jose, CA (US);

Le Huang, San Jose, CA (US);

Tianjia Sun, San Jose, CA (US);

Tiejun Dai, Santa Clara, CA (US);

Assignee:

OmniVision Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/378 (2011.01); H04N 5/365 (2011.01);
U.S. Cl.
CPC ...
H04N 5/378 (2013.01); H04N 5/365 (2013.01);
Abstract

Techniques and mechanisms to mitigate fixed pattern noise in image sensor data. In an embodiment, readout circuitry includes an adaptive analog-to-digital converter (ADC) comprising a differential amplifier and a feedback path coupled across the differential amplifier, where the ADC is to receive a ramp signal, a control signal associated with a transition rate of the ramp signal, and an analog signal generated by one or more pixels. In another embodiment, the feedback path and/or one or more other circuit elements coupled to the differential amplifier are configured, based on the control signal, to provide one of multiple loop gains with the differential amplifier. The ADC provides a digital output to determine a comparison based on the ramp signal and the analog signal.


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