The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Sep. 30, 2016
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Dario Vagni, Villach, AT;

Peter Bogner, Wernberg, AT;

Jaafar Mejri, Ottobrunn, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1071 (2013.01); H03M 1/1245 (2013.01);
Abstract

A method for use in testing an analog-to-digital converter. The method includes providing a set of bins, varying a voltage, taking samples of the voltage, providing a selection flag, associating each sample with one bin of the set of bins, and observing a number of samples associated with the bins. An apparatus includes an analog-to-digital converter configured to convert a voltage at an input node to a digital representation provided at an output node. The input node is configured to be coupled to a voltage generator. A sample select unit is configured to determine if a voltage at the input node at least equals a first threshold level and does not exceed a second threshold level. The apparatus is configured, based on the determining, to selectively associate the digital representation with a bin of a set of bins.


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