The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Mar. 12, 2015
Applicant:
Seiko Instruments Inc., Chiba-shi, Chiba, JP;
Inventors:
Daiki Endo, Chiba, JP;
Fumimasa Azuma, Phnom Penh, KH;
Assignee:
Seiko Instruments Inc., , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 5/04 (2006.01); H02H 7/12 (2006.01); G05F 1/567 (2006.01);
U.S. Cl.
CPC ...
H02H 5/044 (2013.01); G05F 1/567 (2013.01);
Abstract
To provide an overheat protection circuit which is not affected by a leak current while being low in current consumption and good in detection accuracy, and a voltage regulator equipped with the overheat protection circuit. An overheat protection circuit is configured to include a leak current detection circuit which detects that a leak current has flowed at a high temperature, a bias circuit which allows a bias current to flow in response to an output signal of the leak current detection circuit, and a temperature detection circuit operated by the bias current.