The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Jan. 30, 2014
Applicant:

S-printing Solution Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Kwang-ho Kang, Seoul, KR;

Jae-hyeuk Jeong, Seoul, KR;

Jung-ik Choi, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/16 (2006.01); B05C 1/08 (2006.01); H01B 1/12 (2006.01); H01L 51/00 (2006.01); G03G 15/02 (2006.01); G03G 15/08 (2006.01);
U.S. Cl.
CPC ...
H01L 51/004 (2013.01); G03G 15/0233 (2013.01); G03G 15/0818 (2013.01); G03G 15/1685 (2013.01); H01L 51/0043 (2013.01);
Abstract

A semiconductive roller to stably generate high-quality images for a long period of time by efficiently inhibiting migration of free epichlorohydrin (ECH) component to a surface of the semiconductive roller includes an elastic layer formed of a semiconductive rubber composition including about 50 to about 70 parts by weight of a base rubber and about 30 to about 50 parts by weight of a hydrin rubber. An extracted amount of the ECH component from the elastic layer is about 2% by volume or less, wherein the extracted amount is determined based on a reduced amount of chlorine (Cl) intensity measured using X-ray fluorescence (XRF) analysis performed before and after extraction of the ECH component from the elastic layer using tetrahydrofuran (THF).


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