The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Nov. 25, 2014
Applicant:

Celerint, Llc., New York, NY (US);

Inventors:

Howard Roberts, Jr., Austin, TX (US);

LeRoy Growt, Spicewood, TX (US);

Assignee:

CELERINT, LLC., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); H01L 21/67 (2006.01); G06Q 10/04 (2012.01); G06Q 50/04 (2012.01); H01L 21/687 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67276 (2013.01); G06Q 10/04 (2013.01); G06Q 50/04 (2013.01); H01L 21/68707 (2013.01); Y02P 90/30 (2015.11);
Abstract

A method and system are provided for optimizing operational throughput for a semiconductor device handler having multiple stages. The method includes receiving semiconductor devices for testing at an input carrier buffer, and operating the handler in the testing of semiconductor devices. The method also includes recording operational throughput characteristics for each operational stage of the handler, and analyzing recorded operational throughput characteristics for each operational stage of the handler. Additionally, the method includes determining which operational stage of the handler has the most limiting constraint causing a lowest operational drumbeat, and adjusting operational parameters of the operational stage of the handler that has the lowest operational drumbeat to increase the operational drumbeat. The method further includes repeating the method until an operational state is achieved such that further adjustments to operational parameters result in a decrease in the operational throughput for the semiconductor device handler.


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