The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Apr. 28, 2009
Andreas Kühn, Bremen, DE;
Michael W. Linscheid, Berlin, DE;
Katja Tham, Berlin, DE;
Johann-christoph Freytag, Kleinmachnow, DE;
Stephan Werner Heymann, Berlin, DE;
Andreas Kühn, Bremen, DE;
Michael W. Linscheid, Berlin, DE;
Katja Tham, Berlin, DE;
Johann-Christoph Freytag, Kleinmachnow, DE;
Stephan Werner Heymann, Berlin, DE;
Thermo Fisher Scientific (Bremen) GmbH, Bremen, DE;
Abstract
Disclosed herein is a method and an arrangement for the control of measuring systems such as a mass spectrometer or nuclear magnetic resonance (NMR) instrument, the control being based on an online data analysis of the current measurements. Depending on the measurement experiment, the combined result of the data analysis can have either a direct influence on the next measurement or result in a dynamically organized sequence of measurements. The measuring systems may be controlled by establishing a database that comprises information on the objects to be measured, the measurement data which can be detected during the measurement experiments using the measuring systems, and information regarding the relationships between or among items of the measurement data.