The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Oct. 24, 2013
Applicant:

Sharp Kabushiki Kaisha, Osaka, JP;

Inventors:

Yoshifumi Ohta, Osaka, JP;

Kengo Takahama, Osaka, JP;

Assignee:

Sharp Kabushiki Kaisha, Osaka-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/36 (2006.01); G09G 5/10 (2006.01); G09G 3/3233 (2016.01); G09G 3/3283 (2016.01);
U.S. Cl.
CPC ...
G09G 5/10 (2013.01); G09G 3/3233 (2013.01); G09G 3/3283 (2013.01); G09G 2300/0819 (2013.01); G09G 2320/045 (2013.01); G09G 2320/046 (2013.01);
Abstract

A unit equivalent value acquiring unit acquires a normal-temperature unit equivalent use time Δtn by using a temperature sensor, first to third LUTs, and a first multiplying unit. An integration unit acquires an equivalent cumulative use time to by integrating the normal-temperature unit equivalent use time Δtn. A maximum value detecting unit detects a maximum equivalent cumulative use time tnmax. A dividing unit acquires a correction coefficient Kcmp by dividing total degradation E(tnmax,Tn) acquired by a fourth LUT by total degradation E(tn,Tn) acquired by a fifth LUT. Accordingly, there is provided a data processing device for a display device capable of preventing burn-in while suppressing time degradation of an electro-optical element and increase in the number of wires.


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