The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Mar. 16, 2016
Siemens Aktiengesellschaft, Munich, DE;
Dirk Ertel, Neunkirchen am Brand, DE;
Yiannis Kyriakou, Spardorf, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method compensates for image artifacts in a first imaging device for imaging a first subregion of a body. The image artifacts are caused by a second subregion of the body being disposed outside of a first field of view for the first device. First measured data for the first field of view is acquired by the first device. The first subregion lies in the first field of view. Second measured data are acquired for a second field of view in a second imaging device. Image data representing the subregions in the second device are calculated from the second measured data. A model representing the subregions is calibrated using the calculated image data. The data representing the second subregion in the first device are simulated using a calibrated model. A correction of the first measured data is performed using simulated data for reducing the image artifacts.