The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Jun. 24, 2015
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Pablo Sala, Bothell, WA (US);

Norberto Goussies, Buenos Aires, AR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/52 (2006.01); G06K 9/62 (2006.01); G06T 19/00 (2011.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06K 9/52 (2013.01); G06K 9/6201 (2013.01); G06T 7/75 (2017.01); G06T 19/006 (2013.01); G06T 2207/10028 (2013.01);
Abstract

A system includes a memory and a processor configured to select a set of scene point pairs, to determine a respective feature vector for each scene point pair, to find, for each feature vector, a respective plurality of nearest neighbor point pairs in feature vector data of a number of models, to compute, for each nearest neighbor point pair, a respective aligning transformation from the respective scene point pair to the nearest neighbor point pair, thereby defining a respective model-transformation combination for each nearest neighbor point pair, each model-transformation combination specifying the respective aligning transformation and the respective model with which the nearest neighbor point pair is associated, to increment, with each binning of a respective one of the model-transformation combinations, a respective bin counter, and to select one of the model-transformation combinations in accordance with the bin counters to detect an object and estimate a pose of the object.


Find Patent Forward Citations

Loading…