The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Mar. 14, 2014
Applicant:
New York University, New York, NY (US);
Inventors:
Jeyavijayan Rajendran, Brooklyn, NY (US);
Youngok Pino, Rome, NY (US);
Ozgur Sinanoglu, Abu Dhabi, AE;
Ramesh Karri, New York, NY (US);
Assignee:
New York University, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/60 (2013.01); G06F 21/72 (2013.01); G09C 1/00 (2006.01); H04L 9/00 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 21/602 (2013.01); G06F 17/5045 (2013.01); G06F 21/72 (2013.01); G09C 1/00 (2013.01); H04L 9/002 (2013.01); G06F 2217/66 (2013.01); G06F 2221/2111 (2013.01); H04L 2209/04 (2013.01);
Abstract
Exemplary systems, methods and computer-accessible mediums for encrypting at least one integrated circuit (IC) can include determining, using an interference graph, at least one location for a proposed insertion of at least one gate in or at the at least one IC, and inserting the gate(s) into the IC(s) at the location(s). The interference graph can be constructed based at least in part on an effect of the location(s) on at least one further location of the IC(s).