The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Nov. 27, 2013
General Electric Company, Schenectady, NY (US);
Eric Jester, Hoffman Estates, IL (US);
Arun Viswanath, Lake Zurich, IL (US);
Madhu Seepani, Lake In The Hills, IL (US);
Shaoyu Feigler, Barrington, IL (US);
Jeff Chu, Buffalo Grove, IL (US);
Jiaohuan Wang, Schaumburg, IL (US);
Vineet Ahuja, Palatine, IL (US);
Charlotte Mae Shelton, Gilbert, AZ (US);
Rhonda Eckstein, Baileyton, AL (US);
General Electric Company, Schenectady, NY (US);
Abstract
Example methods, systems, and computer readable media are disclosed to allocate a medical exam. An example method includes identifying an exam characteristic associated with the medical exam. The example method includes determining a plurality of allocation scores for a plurality of radiologists by comparing the exam characteristic to a radiologist characteristic for each of the plurality of radiologists. The example method includes determining one of the plurality of allocation scores with a highest value. The example method includes allocating the medical exam to one of the plurality of radiologists associated with the one of the plurality of allocation scores with the highest value. The example method includes marking the medical exam as allocated to the one of the plurality of radiologists associated with the one of the plurality of allocation scores with the highest value. The example method includes providing an indication that the medical exam is allocated via a graphical user interface.