The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Jul. 10, 2015
Applicant:
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Inventor:
Michael Li, Hayes Middlesex, GB;
Assignee:
FUJITSU LIMITED, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01); G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 8/443 (2013.01); G06F 11/3612 (2013.01); G06F 11/3616 (2013.01);
Abstract
A method of testing implementation parameters of a computer program in a distributed environment, the method comprising; testing of alternative implementation parameters in parallel in the distributed environment, and providing a time-out mechanism that aborts testing processes when one of the following abort conditions is satisfied: a time allowed for testing has expired; and testing processes for a predefined number of alternative implementations are complete; wherein the time-out mechanism includes a hardware interface, which is arranged to cause a hardware supported abort.