The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Jun. 25, 2013
Applicant:

Compellent Technologies, Eden Prairie, MN (US);

Inventor:

Ryan Hankins, St. Paul, MN (US);

Assignee:

Dell International L.L.C., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 11/30 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3082 (2013.01); G06F 11/0706 (2013.01); G06F 11/0751 (2013.01); G06F 11/3055 (2013.01); G06F 2201/88 (2013.01);
Abstract

A method for detecting hardware and/or software anomalies in remote systems. The method may include aggregating, in a centralized electronic database, by an electronic database server, data received via a network from each of the remote systems, the data relating to operating statistics of one or more subcomponents of the remote systems over time. The method may also include utilizing an electronic database client communicatively coupled to the centralized database to automatically periodically access and analyze data stored in the centralized database to identify anomalies in hardware and/or software components of the remote systems. In one embodiment, the data relating to operating statistics of the subcomponents may include data from statistics counters corresponding to the subcomponents, each statistics counter, in one state, indicative of an identifiable error. In this regard, analyzing data stored in the centralized database may involve comparing data from the statistics counters to identify the anomalies.


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