The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Dec. 14, 2015
Junichi Mizawa, Kanagawa, JP;
Masato Mukai, Kanagawa, JP;
Toru Ohmine, Kanagawa, JP;
Ichiro Komuro, Tokyo, JP;
Shuuichi Endoh, Saitama, JP;
Kenji Sato, Kanagawa, JP;
Yasuko Yoshikawa, Kanagawa, JP;
Junichi Mizawa, Kanagawa, JP;
Masato Mukai, Kanagawa, JP;
Toru Ohmine, Kanagawa, JP;
Ichiro Komuro, Tokyo, JP;
Shuuichi Endoh, Saitama, JP;
Kenji Sato, Kanagawa, JP;
Yasuko Yoshikawa, Kanagawa, JP;
Ricoh Company, Limited, Tokyo, JP;
Abstract
A positional deviation correction pattern includes a first and second pattern image portions adjacent in a sub-scanning direction at the same position in a main-scanning direction, with the same width in the main-scanning direction. Each image portion includes a first side extending in the sub-scanning direction, a second side continuing from one end of the first side and extending in a direction intersecting the sub-scanning direction, and a third side continuing from the other end and extending in a direction intersecting both the sub-scanning direction and the second side. The second sides have the same inclination angle to a virtual line parallel to the main-scanning direction. The third sides have the same inclination angle to the virtual line. A length of one image portion in the sub-scanning direction gradually increases from one end to the other end in the main-scanning direction, a length of the other image portion gradually decreases.