The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Oct. 02, 2015
Applicant:
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Inventors:
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/24 (2006.01); G02B 26/08 (2006.01); G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 21/24 (2013.01); G02B 27/145 (2013.01); G02B 26/0816 (2013.01); G02B 27/144 (2013.01);
Abstract
A microscope system includes a laser light source, a plurality of laser microscopes, and an optical path switching unit that is provided between the laser light source and the laser microscopes and switches a supply destination of a laser beam among the plurality of laser microscopes by changing a beam splitter to be arranged on an incident optical axis. Each of the laser microscopes includes an optical axis adjustment unit that adjusts an optical axis of the laser beam, and a control unit that controls the optical axis adjustment unit based on identification information about the beam splitter arranged on the incident optical axis.