The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Jun. 26, 2013
Applicant:
General Electric Company, Schenectacy, NY (US);
Inventors:
Alex David Corwin, Niskayuna, NY (US);
Robert John Filkins, Niskayuna, NY (US);
Jun Xie, Niskayuna, NY (US);
Nannan Chen, Clifton Park, NY (US);
Kashan Ali Shaikh, Clifton Park, NY (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01N 1/31 (2006.01); G01N 35/00 (2006.01); G01N 1/30 (2006.01);
U.S. Cl.
CPC ...
G02B 21/008 (2013.01); G01N 1/312 (2013.01); G01N 35/00029 (2013.01); G01N 35/0092 (2013.01); G01N 1/30 (2013.01); G01N 35/0099 (2013.01);
Abstract
A method for processing and imaging a first and second plurality of samples, comprising processing at least one sample from the first plurality of samples, imaging the at least one sample from the first plurality of samples, while being capable of simultaneously processing at least one sample from the second plurality of samples; and imaging the at least one processed sample from the second plurality of samples.