The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Jun. 09, 2014
Applicant:

Mitsubishi Electric Corporation, Chiyoda-ku, Tokyo, JP;

Inventors:

Kenichi Moteki, Tokyo, JP;

Masaki Taguchi, Tokyo, JP;

Assignee:

MITSUBISHI ELECTRIC CORPORATION, Chiyoda-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); G01T 1/208 (2006.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/208 (2013.01); G01T 1/2018 (2013.01); G01T 7/005 (2013.01);
Abstract

A radiation monitoring device includes: a scintillator emitting fluorescence upon absorption of radiation, a photo-multiplier tube converting the fluorescence into an electron pulse, a preamplifier converting the electron pulse into an analog voltage pulse, a pulse amplifier amplifying the analog voltage based on a gain control value, a dose rate measurement part measuring a dose rate based on an output of the pulse amplifier, an average half width measurement part, measuring a half width of a voltage pulse, which is among the outputs of the pulse amplifier and has a wave height larger than a preset value, and processing a predetermined number of measured data on the half widths to calculate a half width deviation, a gain control part receiving the half width deviation from the average half width measurement part, and determining the gain control value using a table, which lists relations between half widths and temperature calibration factors.


Find Patent Forward Citations

Loading…