The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Sep. 23, 2014
Applicant:

Bruker Biospin Ag, Faellanden, CH;

Inventors:

Jacco Douwe van Beek, Volketswil, CH;

Thomas Speck, Thalwil, CH;

Assignee:

Bruker BioSpin AG, Faellanden, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/44 (2006.01); G01R 33/3875 (2006.01); G01R 33/46 (2006.01); G01R 33/58 (2006.01);
U.S. Cl.
CPC ...
G01R 33/443 (2013.01); G01R 33/3875 (2013.01); G01R 33/46 (2013.01); G01R 33/58 (2013.01);
Abstract

A method for homogenizing the static magnetic field with a distribution B(r) in the active volume of a magnetic resonance apparatus having a number N of shim coils defines a target field distribution BT(r) using a filter method in which a norm of the shim currents is influenced by means of filter factors. An optimization procedure works in a parameter space having M control parameters, wherein 2≦M<N. One of the control parameters is used as a weighting parameter for modification of a spatial weighting function and another control parameter is used to control the filter factors. Using this method the hardware limitations can be taken into account when determining the target field distribution, without a significant increase in the computational effort to determine the target field distribution during optimization.


Find Patent Forward Citations

van Beek, Jacco. (2017). Shimming procedure that includes determination of the target field by optimization in a parameter space of reduced dimensionality (U.S. Patent No. 9817097). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9817097

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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