The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Apr. 28, 2016
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Tatsuhiko Kawakami, Tokyo, JP;

Takeshi Kawamura, Tokyo, JP;

Manabu Aoki, Tokyo, JP;

Yukinobu Imamura, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/44 (2006.01); G01R 31/02 (2006.01); H01L 39/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/02 (2013.01); H01L 39/00 (2013.01);
Abstract

An alternating current loss measuring apparatus for superconductors includes a superconductor specimen, a magnetic field applying coil, a radiation shield, a vacuum vessel, first cooling means, and second cooling means. The first cooling means or the second cooling means is provided with a temperature regulating mechanism. The magnetic field applying means and the radiation shield are set to be a first cooling part, whereas the superconductor specimen is set to be a second cooling part, and the first cooling part and the second cooling part are cooled by first and second cooling means, respectively. A high thermal resistance member is disposed between the superconductor specimen and the second cooling means, and temperature measuring means are disposed at at least two positions on the high thermal resistance member. The alternating current loss of a superconductor under an external magnetic field can be measured at each of different temperatures.


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