The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9817032 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 14, 2017

Filed:

May. 16, 2013
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi-shi, Kanagawa-ken, JP;

Inventors:

Kei Takahashi, Kanagawa, JP;

Noboru Inoue, Kanagawa, JP;

Assignee:

Semiconductor Energy Laboratory Co., Ltd., Atsugi-shi, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/36 (2006.01); G01R 1/067 (2006.01); G01R 31/27 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/36 (2013.01); G01R 1/06766 (2013.01); G01R 31/27 (2013.01); G09G 3/006 (2013.01);
Abstract

To provide a measurement device which allows long-term accurate measurement of voltage without adversely affecting a device under test, by ensuring a predetermined level of resistance to ESD and reducing leakage current. A measurement device includes a probe needle for contacting a device under test, a first FET for detecting voltage of the device under test, and a protection circuit for protecting the first FET from static electricity. The protection circuit includes a second FET having an oxide semiconductor film as a channel formation region.


Find Patent Forward Citations

Takahashi, Kei. (2017). Measurement device (U.S. Patent No. 9817032). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9817032

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