The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Mar. 09, 2015
Applicant:

Primax Electronics Ltd., Taipei, TW;

Inventor:

Pei-Ming Chang, Taipei, TW;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01R 1/18 (2006.01); G01R 31/28 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/18 (2013.01); G01R 31/2808 (2013.01); G01R 1/06722 (2013.01);
Abstract

A testing device includes a base body, a holder, an electrically conductive plate, plural testing probes and plural insulation structures. The testing device of the present invention uses the electrically conductive plate to replace the plastic plate of the conventional testing device. Consequently, the electrostatic discharge effect is avoided. Moreover, the insulation structure is arranged between the testing probe and the electrically conductive plate to separate the testing probe from the electrically conductive plate so as to avoid the electric leakage problem. Consequently, the testing device of the present invention is capable of avoiding the electrostatic discharge effect without causing damage of the under-test object and reducing the measurement accuracy.


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