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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9816983 B1

PDFFull Text
Date of Patent:
Nov. 14, 2017

Filed:

Jan. 23, 2015

Sample analyzer

Applicant:

Sysmex Corporation, Kobe-Shi, Hyogo, JP;

Inventors:

Daigo Fukuma, Kobe, JP;

Takaaki Nagai, Kobe, JP;

Masaharu Shibata, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe-shi, JP;

Attorney:

MetroLexis Law Group, PLLC

Primary Examiner:

P Kathryn Wright

Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G01N 33/49 (2006.01); G01N 15/14 (2006.01); G01N 21/17 (2006.01); G01N 27/00 (2006.01); G01N 15/06 (2006.01); G01N 15/10 (2006.01); G01N 15/12 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5094 (2013.01); G01N 15/06 (2013.01); G01N 15/0656 (2013.01); G01N 15/12 (2013.01); G01N 15/14 (2013.01); G01N 15/147 (2013.01); G01N 21/17 (2013.01); G01N 27/00 (2013.01); G01N 33/4915 (2013.01); G01N 2015/0084 (2013.01); G01N 2015/0693 (2013.01); G01N 2015/1037 (2013.01); G01N 2015/1254 (2013.01);
Abstract

A sample analyzer comprising: a sample preparing section for preparing first and second measurement sample including reagent and sample; a first detector for detecting a predetermined component in the first measurement sample prepared by the sample preparing section; a second detector for detecting the predetermined component in the second measurement sample prepared by the sample preparing section; and a controller configured for performing operations, comprising: (a) controlling the first detector to detect the predetermined component in the first measurement sample prepared by the sample preparing section; (b) determining the reliability of the result detected by the first detector; (c) controlling the sample preparing section to prepare the second measurement sample from the same sample when the result has been determined to be unreliable; and (d) controlling the second detector to detect the predetermined component in the second measurement sample, is disclosed.

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