The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Apr. 17, 2015
University of Georgia Research Foundation, Inc., Athens, GA (US);
Mark A. Haidekker, Athens, GA (US);
Richard Speir, Loganville, GA (US);
University of Georgia Research Foundation, Inc., Athens, GA (US);
Abstract
The present disclosure encompasses embodiments of X-ray computed tomography-based methods for the detection of onion quality factors. Such methods are advantageous in detecting internal damage to onion bulbs due to bacterial and fungal rots and mechanical damage while also providing for the overall assessment of onion bulb quality and market value. Because CT images provide cross-sectional reconstructions of the subject under study, CT scans of onion bulbs can be used not only to detect damage from disease, but also cuts and bruises that increase an onion bulb's susceptibility to disease, and the presence of shoots or seed stems and overall shape of the bulbs.