The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Feb. 20, 2015
Applicant:

Arkray, Inc., Kyoto, JP;

Inventors:

Takashige Tanaka, Kyoto, JP;

Yasunori Shiraki, Kyoto, JP;

Akitsugu Kudo, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/30 (2006.01); G01N 21/68 (2006.01); G01N 21/69 (2006.01); G01N 21/71 (2006.01); G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
G01N 21/68 (2013.01); G01N 21/69 (2013.01); G01N 21/71 (2013.01); G01N 33/48 (2013.01);
Abstract

A plasma spectrometry method with high reproducibility of plasma light emission is described, wherein the method comprises: a detection step of applying a voltage, thereby detecting the resulting plasma light emission; and non-detection step of detecting no plasma light emission.


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