The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Nov. 18, 2014
Kemira Oyj, Helsinki, FI;
Vesa Nuutinen, Helsinki, FI;
Susanna Toivonen, Espoo, FI;
James Johnstone, Banchory, GB;
Harri Härmä, Turku, FI;
Mirva Lehmusto, Turku, FI;
Satu Tiittanen, Turku, FI;
Pave Väisänen, Helsinki, FI;
Joonas Siivonen, Turku, FI;
Paul Mundill, Espoo, FI;
KEMIRA OYJ, Helsinki, FI;
Abstract
The invention relates to a method for analysing a sample comprising at least a first and a second scale inhibitor, which scale inhibitors are synthetic organic compounds comprising at least one ionised group. The method comprises optionally diluting and/or purifying the sample, and allowing the sample interact with a reagent comprising lanthanide(III) ion. The sample is excited at a first excitation wavelength and a sample signal deriving from the lanthanide(III) ion is detected at a signal wavelength by using time-resolved luminescence measurement. The total concentration of the first and the second scale inhibitor is determined by using the detected sample signal, and the concentration of the first scale inhibitor in the sample is determined. The concentration of the second scale inhibitor is determined mathematically by using the obtained results for the total concentration and for the first scale inhibitor concentration.