The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Aug. 17, 2012
E. Neil Lewis, Olney, MD (US);
E. Neil Lewis, Olney, MD (US);
Malvern Instruments Limited, Malvern, GB;
Abstract
The invention relates to methods and apparatus for detecting properties of suspended particles. Embodiments disclosed include an optical instrument () for detecting properties of a sample, comprising: a sample cell () for holding a sample of a particulate dispersion; a coherent light source () configured to illuminate the sample in the sample cell (); a light intensity detector () positioned to receive and measure an intensity of light from the coherent light source () elastically scattered by the sample in the sample cell (); and a spectral light detector () positioned and configured to receive and measure a range of wavelengths of light from the coherent radiation source () inelastically scattered by the sample in the sample cell ().