The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Nov. 14, 2014
Beckman Coulter, Inc., Brea, CA (US);
Antao Chen, Palmetto Bay, FL (US);
Juan J. Fernandez De Castro, Miami, FL (US);
Paul K. Church, Miami, FL (US);
Beckman Coulter, Inc., Brea, CA (US);
Abstract
High numerical aperture collection optics for particle analyzers may include an ellipsoidal reflector or an ellipsoidal reflector in combination with a spherical reflector, and may efficiently collect light scattered or emitted by particles in a sample stream and then couple that collected light into a lower numerical aperture portion of the instrument's optical detection system, such as into an optical fiber for example. The reflectors may be integrated with a flow cell through which the sample stream passes, or may be separate components arranged around a flow cell or, in instruments not employing a flow cell, arranged around a sample stream in air. Refractive beam steering optics may allow multiple closely spaced excitation beams to be directed into the sample stream at low angles of incidence. The collection optics and refractive beam steering optics may be employed separately or in combination with each other.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile