The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Jul. 11, 2014
Netzsch-gerätebau Gmbh, Selb, DE;
Thomas Denner, Selb, DE;
Juergen Blumm, Selb, DE;
Otto Max Schaefer, Selb, DE;
Markus Hollering, Wunsiedel, DE;
Thilo Hilpert, Selb, DE;
Alexander Frenzl, Schoenwald, DE;
Stefan Lauterbach, Selb, DE;
Andreas Strobel, Auerbach, DE;
Gabriele Kaiser, Selb, DE;
Stephan Knappe, Doehlau, DE;
Rolf Preuss, Einbeck, DE;
Michael Gebhardt, Selb, DE;
Elena Moukhina, Selb, DE;
Alexander Schindler, Leupoldsgruen, DE;
Matthias Gradl, Sesslach, DE;
Gunther Herr, Haarth, DE;
André Nijmeh, Merkendorf, DE;
Stefan Schmoelzer, Issigau, DE;
Markus Meyer, Ehingen, DE;
Netzsch-Gerätebau GmbH, Selb, DE;
Abstract
A method for evaluating a measurement result of a thermal analysis. A program-controlled computer unit is used to calculate at least one probability of the agreement of the measurement result with at least one dataset previously stored in the computer unit, wherein this calculation is based on a comparison of effect data previously extracted from a measurement curve of the thermal analysis with corresponding stored effect data of the dataset. The evaluation can advantageously include, an automatic recognition and classification of measurement curves and can be carried out in particular more efficiently, more economically and more quickly than previously, with at the same time a high quality of evaluation.