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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9816801 B1

PDFFull Text
Date of Patent:
Nov. 14, 2017

Filed:

Mar. 17, 2016

System and a method for quantitative sample imaging using off-axis interferometry with extended field of view or faster frame rate

Applicant:

Ramot AT Tel-aviv University Ltd., Tel Aviv, IL;

Inventors:

Pinhas Girshovitz, Beer Sheva, IL;

Natan Tzvi Shaked, Rishon Lezion, IL;

Assignee:

RAMOT AT TEL AVIV UNIVERSITY LTD, Tel Aviv, IL;

Attorney:

Browdy and Neimark, PLLC

Primary Examiner:

Jonathan Hansen

Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 9/04 (2006.01); G02B 21/00 (2006.01); G02B 21/14 (2006.01); G03H 1/26 (2006.01); G01B 11/06 (2006.01); G02B 5/12 (2006.01); G02B 17/08 (2006.01); G02B 27/10 (2006.01); G02B 27/28 (2006.01); G03H 1/04 (2006.01);
U.S. Cl.
CPC ...
G01B 9/0203 (2013.01); G01B 9/02011 (2013.01); G01B 9/02027 (2013.01); G01B 9/02028 (2013.01); G01B 9/02041 (2013.01); G01B 9/02047 (2013.01); G01B 9/02085 (2013.01); G01B 9/02097 (2013.01); G01B 9/04 (2013.01); G01B 11/06 (2013.01); G02B 5/12 (2013.01); G02B 17/08 (2013.01); G02B 21/0056 (2013.01); G02B 21/14 (2013.01); G02B 27/106 (2013.01); G02B 27/283 (2013.01); G03H 1/0443 (2013.01); G03H 1/265 (2013.01); G03H 2001/046 (2013.01); G03H 2001/0445 (2013.01); G03H 2001/0456 (2013.01);
Abstract

The present invention provides a sample inspection and quantitative imaging system and method for performing off-axis interferometric imaging while enabling to record off-axis holograms in an extended field of view (FOV) than possible using a given camera and imaging setup, and thus to enlarge (e.g. double, triple, or even more than this) the interferometric FOV, without changing the imaging parameters, such as the magnification and the resolution.

Find Patent Forward Citations

Girshovitz, Pinhas. (2017). System and a method for quantitative sample imaging using off-axis interferometry with extended field of view or faster frame rate (U.S. Patent No. 9816801). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9816801

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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