The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Nov. 11, 2014
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Hui-Hsin Lu, New Taipei, TW;

Wei-Hsin Wang, Taipei, TW;

Jiun-Lin Guo, Hsinchu, TW;

Shih-Chung Lee, Miaoli County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/06 (2006.01); H01J 35/10 (2006.01); H01J 35/16 (2006.01); H01J 35/18 (2006.01); H01J 35/24 (2006.01); G21K 1/04 (2006.01);
U.S. Cl.
CPC ...
H01J 35/10 (2013.01); H01J 35/16 (2013.01); H01J 35/18 (2013.01); H01J 35/24 (2013.01); G21K 1/043 (2013.01); H01J 35/06 (2013.01); H01J 2235/08 (2013.01); H01J 2235/086 (2013.01); H01J 2235/168 (2013.01); H01J 2235/18 (2013.01);
Abstract

An X-ray imaging method including the following steps is provided. An X-ray source is provided, wherein the X-ray source includes a housing, a cathode, and an anode target. The housing has an end window. The cathode is disposed in the housing, and the anode target is disposed beside the end window. The cathode is caused to provide an electron beam. A portion of the electron beam hits at least a part of areas of the anode target to generate an X-ray and the X-ray is emitted out of the housing through the end window. The X-ray is caused to irradiate an object to generate X-ray image information. An image detector is used to receive the X-ray image information.


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