The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Sep. 22, 2015
Applicant:

Knuedge, Inc., San Diego, CA (US);

Inventors:

David C Bradley, La Jolla, CA (US);

Yao Morin, San Diego, CA (US);

Assignee:

KNUEDGE, INC., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 15/00 (2006.01); G10L 21/0216 (2013.01); G10L 21/0264 (2013.01);
U.S. Cl.
CPC ...
G10L 21/0216 (2013.01); G10L 21/0264 (2013.01);
Abstract

Devices, systems and methods are disclosed for estimating characteristics of noise included in one-dimensional data. For example, a number of data points associated with noise below each of a plurality of thresholds may be determined to calculate a cumulative distribution function. A probability density function may be derived from the cumulative distribution function. A variance may be calculated from the cumulative distribution function and/or the probability density function. The noise may be modeled using the variance and other characteristics determined from the cumulative distribution function and/or the probability density function.


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