The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2017
Filed:
Oct. 10, 2014
Siemens Aktiengesellschaft, Munich, DE;
Thomas Flohr, Uehlfeld, DE;
Michael Scheuering, Nuremberg, DE;
Bernhard Schmidt, Fuerth, DE;
Martin Sedlmair, Zirndorf, DE;
Grzegorz Soza, Heroldsberg, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method and an imaging system are disclosed. The method, for determining at least one value of at least one recording parameter for a recording of an X-ray image of a patient positioned on an examination table, uses contactless scanning of at least part of the surface of the patient via at least one electromagnetic sensor, to calculate the three-dimensional contour of the scanned surface without additional exposure to radiation. At least one anatomic landmark of the patient can be identified using the three-dimensional contour, and the position of the anatomic landmark is determinable in the coordinate system of the table. The value of the recording parameter is determinable using the position of the anatomic landmark. The value of the recording parameter is determinable quickly and easily since contactless scanning of surfaces can be achieved quickly and easily in terms of technology.