The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2017
Filed:
Jul. 18, 2016
Kurion, Inc., Irvine, CA (US);
Joseph W. Maresca, Jr., Sunnyvale, CA (US);
Wilhelmina C. Leuschen, Kennewick, WA (US);
Marissa L. Ammer, Kennewick, WA (US);
KURION, INC., Irvine, CA (US);
Abstract
A method and an apparatus for automatically collecting and processing nondestructive test (NDT) data to determine the presence, type, location, size, and strength of defects in composite, honeycomb, and grid structures like those found in aircraft, wind blades, boats, cars, building structures. The preferred embodiment is comprised of an uncooled IR mounted on a frame, a conductive heating mat, an IR Ruler with fiducials in a recognizable pattern, a computer, a processor, and output displays. The data collection, processing, and display output can be controlled or reviewed remotely via the internet. The processing, location, and output displays can be applied to any NDT system that collects and processes a two dimensional amplitude image (e.g., x-ray systems).