The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2017
Filed:
Sep. 29, 2014
Ihi Corporation, Koto-ku, JP;
The University of Tokyo, Bunkyo-ku, JP;
Hiroyuki Hishida, Koto-ku, JP;
Koichi Inagaki, Koto-ku, JP;
Takeshi Nakamura, Koto-ku, JP;
Takashi Michikawa, Bunkyo-ku, JP;
Hiromasa Suzuki, Bunkyo-ku, JP;
IHI CORPORATION, Koto-ku, JP;
THE UNIVERSITY OF TOKYO, Bunkyo-ku, JP;
Abstract
An image analyzing apparatus, a non-transitory computer readable medium storing a program, and a method are provided for extracting voids from a three-dimensional image of a fiber-reinforced composite material. The image analyzing apparatus includes a processor which executes image processing to the three-dimensional image. The processor binarizes the three-dimensional image and creates a binary image, transforms the binary image into a distance and creates a distance image, executes closing processing to the binary image by using the distance image, extracts voids from differences between images before and after the closing processing, among the extracted voids, classifies voids that are adjacent to a background voxel as open voids, and classifies voids that are not adjacent to a background voxel as closed voids, and executes opening processing to the open voids in order to eliminate fake voids.