The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Jul. 06, 2015
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Sairam Sundaresan, San Diego, CA (US);

Dashan Gao, San Diego, CA (US);

Xin Zhong, San Diego, CA (US);

Yingyong Qi, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/52 (2006.01); G06T 7/215 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00624 (2013.01); G06K 9/46 (2013.01); G06K 9/52 (2013.01); G06T 7/215 (2017.01); G06K 2009/4666 (2013.01); G06T 2207/10016 (2013.01); G06T 2210/12 (2013.01);
Abstract

A method performed by an electronic device is described. The method includes determining a local motion pattern by determining a set of local motion vectors within a region of interest between a previous frame and a current frame. The method also includes determining a global motion pattern by determining a set of global motion vectors between the previous frame and the current frame. The method further includes calculating a separation metric based on the local motion pattern and the global motion pattern. The separation metric indicates a motion difference between the local motion pattern and the global motion pattern. The method additionally includes tracking an object based on the separation metric.


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