The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Sep. 27, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Dong Xiang, Shanghai, CN;

Stephen Todd, Shrewsbury, MA (US);

Qiyan Chen, Shanghai, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30557 (2013.01);
Abstract

A data analytics workload is obtained, wherein the data analytics workload includes one or more execution parameters and an input data set. An identifier specific to the data analytics workload is generated. The data analytics workload is at least partially executed based on the one or more execution parameters and the input data set to generate an output data set. Meta data associated with the output data set generated by execution of the data analytics workload is obtained, wherein the meta data includes lineage information corresponding to the output data set generated by execution of the input data set. The meta data is registered in a meta data store.


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