The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Apr. 01, 2016
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Min Feng, Princeton, NJ (US);

Giuseppe Coviello, Plainsboro, NJ (US);

Srimat Chakradhar, Manalapan, NJ (US);

Nitin Agrawal, East Brunswick, NJ (US);

Yi Yang, Plainsboro, NJ (US);

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06F 17/30 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30277 (2013.01); G06F 17/30256 (2013.01); G06K 9/00268 (2013.01); G06K 9/00711 (2013.01); G06K 9/6219 (2013.01); G06K 9/6223 (2013.01); G06K 9/6272 (2013.01);
Abstract

Systems and methods for recognizing a face are disclosed and includes receiving images of faces; generating feature vectors of the images; generating clusters of feature vectors each with a centroids or a cluster representative; for a query to search for a face, generating corresponding feature vectors for the face and comparing the feature vector with the centroids of all clusters; for clusters above a similarity threshold, comparing cluster members with the corresponding feature vector; and indicating as matching candidates for cluster members with similarity above a threshold.


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