The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Feb. 01, 2016
Applicant:

Qualcomm Innovation Center, Inc., San Diego, CA (US);

Inventors:

Dineel D. Sule, San Diego, CA (US);

Subrato K. De, San Diego, CA (US);

Wilson Kwan, Markham, CA;

Assignee:

QUALCOMM Innovation Center, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01); G06F 9/45 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 8/443 (2013.01); G06F 8/70 (2013.01); G06F 11/34 (2013.01); G06F 11/3612 (2013.01);
Abstract

Systems and methods for profiling application code are disclosed. The method is hybrid in nature as it may include inserting instrumentation within application code and also periodic sample gathering, by employing a runtime app profile generator that provides the hybrid profiling infrastructure and is linked to the application code. An executable user application is then generated from the application code, and the executable user application is executed. The runtime app profile generator is then launched in response to the execution of the application code, and hybrid profiling results are generated by obtaining samples from the different threads of the executed application code and accumulating instrumented execution information. In some implementations, the hybrid profiling results capture even cold regions of the code and can also be used for a next round of profiling through automated targeted instrumentation.


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