The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Dec. 18, 2015
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Peng Li, Milpitas, CA (US);

Hideo Tanida, Kawasaki, JP;

Huaxin Pang, Sunnyvale, CA (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01);
Abstract

A computer implemented method of software testing may include obtaining multiple interactive elements from an event-driven software application. The interactive elements may be configured to be selected by a user and when selected result in an event in the event-driven software application. The method may also include determining which of the interactive elements may be user interactive in a first state of the event-driven software application. In some embodiments, determining which of the interactive elements may be user interactive may include obtaining one or more coordinates of a first interactive element and determining if the first interactive element is a top layer interactive element at any one of the one or more coordinates. The method may further include testing the event-driven software application based on the user interactive elements.


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